Publications

198 results for Vijay Narayanan

Fundamental understanding and optimization of PBTI in nFETs with SiO ₂/HfO₂ gate stack
- - E. Cartier
  - B.P. Linder
  - et al.
- 2006
- IEDM 2006
Poly-Si/AlN/HfSiO stack for ideal threshold voltage and mobility in sub-100 nm MOSFETs
- - K.-L. Lee
  - M.M. Frank
  - et al.
- 2006
- VLSI Technology 2006
Band-edge high-performance high-κ /metal gate n-MOSFETs using cap layers containing group IIA and IIIB elements with gate-first processing for 45 nm and beyond
- - V. Narayanan
  - V.K. Paruchuri
  - et al.
- 2006
- VLSI Technology 2006
Charge defects, Vt shifts, and the solution to the high-k metal gate n-MOSFET problem
- - Supratik Guha
  - Vijay Narayanan
  - et al.
- 2006
- Advanced Gate Stack, Source/Drain, and Channel Engineering for Si-Based CMOS 2006
Advanced high-κ dielectric stacks with polySi and metal gates: Recent progress and current challenges
- - Evgeni P. Gusev
  - Vijay Narayanan
  - et al.
- 2006
- IBM J. Res. Dev
Process optimization for high electron mobility in nMOSFETs with aggressively scaled HfO₂/metal stacks
- - V. Narayanan
  - K. Maitra
  - et al.
- 2006
- IEEE Electron Device Letters
Transistor scaling with novel materials
- - Meikei Ieong
  - Vijay Narayanan
  - et al.
- 2006
- Materials Today
Optimization of high κ gate stacks with poly-Si, FUSI and metal electrodes
- - R. Jammy
  - V. Narayanan
  - et al.
- 2005
- ISTC 2005
HfO ₂/metal stacks: Determination of energy level diagram, work functions & their dependence on metal deposition
- - S. Zafar
  - V. Narayanan
  - et al.
- 2005
- VLSI Technology 2005
On the location and magnitude of trapped charge in poly- Si ALD-Al ₂O₃ capped Hf-silicate gate stacks
- - Kingsuk Maitra
  - Barry P. Linder
  - et al.
- 2005
- PRiME/ECS Meeting 2005