IA
Ishtiaq Ahsan
Senior Manager, Yield/ Test & Characterization, IBM Semiconductor Technology Research & Development
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NM
Neil McGlohon
Staff Research Scientist
HB
Huiming Bu
Vice President: IBM Semiconductors Global R&D and Albany Operations
DM
Dominik Metzler
Advisory Engineer, BEOL RIE
TP
Timothy Philicelli
Staff Research Scientist
JD
James Demarest
Physical Characterization
CB
Chris Bottoms
Research Lithography Process Engineer
CM
Cody J Murray
Manager: Metrology Research
VC
Victor Chan
Yield learning & Diag Eng Prof
TY
Tenko Yamashita
Senior Manager - Advanced Logic Pathfinding Technology
LM
Lane Meyer
Industrial Engineering
CR
Carl Radens
Semiconductor Memory Research and Development
HJ
Hemanth Jagannathan
IBM Distinguished Engineer - Chiplet and Advanced Packaging Technology & Quantum 300mm Scale-out
KM
Kim Morris
Senior Manager Albany Equipment Engineering and Capital Strategy
LM
Luciana Meli
Senior Manager: Patterning & Metrology
MA
Minhaz Abedin
DTCO
JW
Jean Wynne
Senior Manager of Operations, Fab Manager
DD
Dan J. Dechene
Director, Semiconductor Enablement
HH
Huai Huang
BEOL Reliability, Quality and Characterization
NL
Nick Lanzillo
Research Staff Member
NL
Nicolas Loubet
STSM, Advanced Logic Technology Research
TW
Teresa Wu
Program Director, Semiconductors
JF
Julien Frougier
Senior Engineer: IBM Semiconductors - Advanced Logic Technology Research
JM
Jim Mazza
DTCO