Single Crystal Silicon Films on Amorphous Insulators: Growth by Lateral Nucleated Epitaxy Using Scanning Laser and Electron Beams and Evaluation by Electron Backscattering ContrastT.O. SedgwickR.H. Geisset al.2019JES
Direct Evidence for 1 nm Pores in “Dry” Thermal SiO2 from High Resolution Transmission Electron MicroscopyJ.M. GibsonD.W. Dong2019JES
Effects of Several Parameters on the Corrosion Rates of Al Conductors in Integrated CircuitsIsrael LernerJerome M. Eldridge2019JES
The Dependence of the Memory Effect in ZnS:Mn A-C Thin Film Electroluminescence on Mn DistributionV. MarrelloA.A. Onton2019JES