Calculating the error in long term oxide reliability estimates
- B.P. Linder
- J.H. Stathis
- et al.
- 2001
- IRPS 2001
Publications
169 results for Jim Stathis
Calculating the error in long term oxide reliability estimates
- B.P. Linder
- J.H. Stathis
- et al.
- 2001
- IRPS 2001
Physical and predictive models of ultra thin oxide reliability in CMOS devices and circuits
- 2001
- IRPS 2001
Physical and predictive models of ultra thin oxide reliability in CMOS devices and circuits
- 2001
- IRPS 2001
Softening of breakdown in ultra-thin gate oxide nMOSFETs at low inversion layer density
- S. Lombardo
- F. Crupi
- et al.
- 2001
- Annual Proceedings - Reliability Physics (Symposium)
Photoluminescence characterization of defects in thermal oxide
- Hiroyuki Nishikawa
- James H. Stathis
- 1999
- MRS Proceedings 1999
Breakdown measurements of ultra-thin SiO2 at low voltage
- J.H. Stathis
- A. Vayshenker
- et al.
- 2000
- VLSI Technology 2000
Ultra-thin oxide reliability for ULSI applications
- Ernest Y. Wu
- James H. Stathis
- et al.
- 2000
- Semiconductor Science and Technology
Gate oxide breakdown under Current Limited Constant Voltage Stress
- B.P. Linder
- J.H. Stathis
- et al.
- 2000
- Digest of Technical Papers-Symposium on VLSI Technology
Aspects of defects in silica related to dielectric breakdown of gate oxides in MOSFETs
- Peter E. Blöchl
- James H. Stathis
- 1999
- Physica B: Condensed Matter