R.D. Murphy, R.O. Watts
Journal of Low Temperature Physics
Defects in silica related to hydrogen and oxygen vacancies have been analyzed using first principles density functional calculations. The hydrogen bridge has been identified as the defect responsible for the stress-induced leakage current, a forerunner of dielectric breakdown. The question of Joule heating of the oxide as a result of dielectric breakdown is discussed. A classification scheme for defects in the short-range structure of silica is presented.
R.D. Murphy, R.O. Watts
Journal of Low Temperature Physics
Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
A. Nagarajan, S. Mukherjee, et al.
Journal of Applied Mechanics, Transactions ASME
P. Martensson, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films