A multilevel method for solving operator equations
- Zhongying Chen
- Charles A. Micchelli
- et al.
- 2001
- J. Math. Anal. Appl.
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3489 results for Mathematical Sciences
The edge versus path incidence matrix of series-parallel graphs and greedy packing
- Alan J. Hoffman
- Baruch Schieber
- 2001
- Discrete Applied Mathematics
The L∞ Voronoi diagram of segments and VLSI applications
- Evanthia Papadopoulou
- D.T. Lee
- 2001
- International Journal of Computational Geometry and Applications
A combination fingerprint classifier
- A.W. Senior
- 2001
- IEEE Transactions on Pattern Analysis and Machine Intelligence
A high performance E-beam resist coupling excellent dry etch resistance and sub 100nm resolution for advanced mask making
- Wu-Song Huang
- Ranee Kwong
- et al.
- 2001
- Proceedings of SPIE - The International Society for Optical Engineering
Polymer design for 157 nm chemically amplified resists
- Hiroshi Ito
- Greg M. Wallraff
- et al.
- 2001
- Proceedings of SPIE - The International Society for Optical Engineering
The rational design of bleachable non-chemically amplified DUV photoactive compounds
- Benjamen M. Rathsack
- Peter I. Tattersall
- et al.
- 2001
- Proceedings of SPIE - The International Society for Optical Engineering
IBM 193nm bilayer resist: Materials, lithographic performance and optimization
- Ranee Kwong
- P. Rao Varanasi
- et al.
- 2001
- Proceedings of SPIE - The International Society for Optical Engineering
Image collapse issues in photoresist
- John Simons
- Dario Goldfarb
- et al.
- 2001
- Proceedings of SPIE - The International Society for Optical Engineering
High resolution patterning in chemically amplified resists: The effect of film thickness
- David R. Medeiros
- Wayne M. Moreau
- et al.
- 2001
- Proceedings of SPIE - The International Society for Optical Engineering