Discussion of ways to energy-filter the electron backscattering pattern (EBSP) in the scanning electron microscope (SEM)
- Oliver C. Wells
- 2002
- Microscopy and Microanalysis
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52 results for O.C. Wells
Penetration effect at sharp edges in the scanning electron microscope
- O.C. Wells
- 2011
- Scanning
Ion damage to the specimen in the SEM studied by the EBIC technique
- O.C. Wells
- 2011
- Scanning
Studies of contamination build up in the SEM using the bse imaging technique
- O.C. Wells
- C.F. Aliotta
- 2011
- Scanning
Enhancement of type‐2 magnetic contrast in the bse image in the SEM by a lock‐in technique
- O.C. Wells
- R.J. Savoy
- 2011
- Scanning
Effects of collector take‐off angle and energy filtering on the BSE image in the SEM
- Oliver C. Wells
- 2011
- Scanning
Reduction of edge penetration effect in the scanning electron microscope
- Oliver C. Wells
- 2011
- Scanning
Scanning reflection image from a solid specimen in the scanning electron microscope with a condenser‐objective lens
- O.C. Wells
- 2011
- Scanning
Method for measuring the field from a magnetic recording head in the scanning electron microscope
- Oliver C. Wells
- 2011
- Journal of Microscopy
Fundamental theorem for type‐1 magnetic contrast in the scanning electron microscope (SEM)
- Oliver C. Wells
- 2011
- Journal of Microscopy