Journal of Microscopy

Paper

02 Aug 2011

Relationship between type‐1 magnetic contrast in the scanning electron microscope and the vector potential of the magnetic field

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Abstract

No abstract available.

Paper

Use of backscattered electron detector arrays for forming backscattered electron images in the scanning electron microscope

Oliver C. Wells, L. Gignac, et al.

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Schlieren method as applied to magnetic recording heads in the scanning electron microscope

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Applied Physics Letters

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Effects of collector take‐off angle and energy filtering on the BSE image in the SEM

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Some theoretical aspects of type‐1 magnetic contrast in the scanning electron microscope

Oliver C. Wells

Journal of Microscopy

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