PaperMethod for measuring the field from a magnetic recording head in the scanning electron microscopeOliver C. WellsJournal of Microscopy
Conference paperPast, present, and future of backscatter electron (BSE) imagingOliver C. Wells, Michael S. Gordon, et al.ScMi 2012
Conference paperThe fiftieth anniversary of the first applications of the scanning electron microscope in materials researchKenneth C.A. Smith, Oliver C. Wells, et al.IC-CPO 2006