PaperExamination of uncoated photoresist by the low-loss electron method in the scanning electron microscopeOliver C. Wells, Ping-Chin ChengJournal of Applied Physics
PaperFundamental theorem for type‐1 magnetic contrast in the scanning electron microscope (SEM)Oliver C. WellsJournal of Microscopy
PaperMagnetic Domains in Thin-Film Recording Heads as Observed in the SEM by a Lock-In TechniqueOliver C. Wells, Richard J. SavoyIEEE Transactions on Magnetics
