Backscattered electron imaging in the scanning electron microscope: The use of either: (A) high incident energy or (b) an array detector

E. Liniger, C.-K. Hu, et al.

Journal of Applied Physics

J. Li, A. Lamberti, et al.

ECS Meeting 2008

T. Shibauchi, L. Krusin-Elbaum, et al.

Journal of Magnetism and Magnetic Materials

K.P. Rodbell, L. Gignac, et al.

Journal of Applied Physics