PaperTop-down topography of deeply etched silicon in the scanning electron microscopeOliver C. Wells, Conal E. Murray, et al.Review of Scientific Instruments
PaperReciprocity between the reflection electron microscope and the low-loss scanning electron microscopeOliver C. WellsApplied Physics Letters
PaperMethod for measuring the field from a magnetic recording head in the scanning electron microscopeOliver C. WellsJournal of Microscopy
PaperRelationship between type‐1 magnetic contrast in the scanning electron microscope and the vector potential of the magnetic fieldOliver C. Wells, Catherine A. StoyeJournal of Microscopy
