Journal of Microscopy

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02 Aug 2011

Fundamental theorem for type‐1 magnetic contrast in the scanning electron microscope (SEM)

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Abstract

No abstract available.

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Ultramicroscopy

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Discussion of ways to energy-filter the electron backscattering pattern (EBSP) in the scanning electron microscope (SEM)

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Magnetically filtered low-loss scanning electron microscopy

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Applied Physics Letters

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Isolation of type-2 magnetic contrast in the SEM by a lock-in technique

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