Journal of Microscopy

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02 Aug 2011

Fundamental theorem for type‐1 magnetic contrast in the scanning electron microscope (SEM)

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Abstract

No abstract available.

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Comparison of different models for the generation of electron backscattering patterns in the scanning electron microscope

Oliver C. Wells

Scanning

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Magnetic Domains in Thin-Film Recording Heads as Observed in the SEM by a Lock-In Technique

Oliver C. Wells, Richard J. Savoy

IEEE Transactions on Magnetics

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Isolation of type-2 magnetic contrast in the SEM by a lock-in technique

Oliver C. Wells

Applied Physics Letters

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New contrast mechanism for scanning electron microscope

Oliver C. Wells

Applied Physics Letters

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