Publications

60 results for Miaomiao Wang

Superior PBTI reliability for SOI FinFET technologies and its physical understanding
- - Miaomiao Wang
  - Ramachandran Muralidhar
  - et al.
- 2013
- IEEE Electron Device Letters
Detailed study of fast transient relaxation of Vt instability in HKMG nFETs
- - K. Zhao
  - James Stathis
  - et al.
- 2012
- IRPS 2012
Analysis of parasitic resistance in double gate FinFETs with different fin lengths
- - X. Yang
  - Kingsuk Maitra
  - et al.
- 2011
- IEEE International SOI Conference 2011
ETSOI CMOS for system-on-chip applications featuring 22nm gate length, sub-100nm gate pitch, and 0.08μm² SRAM cell
- - Kangguo Cheng
  - A. Khakifirooz
  - et al.
- 2011
- VLSI Circuits 2011
ETSOI CMOS for system-on-chip applications featuring 22nm gate length, sub-100nm gate pitch, and 0.08μm² SRAM cell
- - Kangguo Cheng
  - A. Khakifirooz
  - et al.
- 2011
- VLSI Technology 2011
Sub-25nm FinFET with advanced fin formation and short channel effect engineering
- - Tenko Yamashita
  - Veeraraghvan S. Basker
  - et al.
- 2011
- VLSI Technology 2011
Full metal gate with borderless contact for 14 nm and beyond
- - Soon-Cheon Seo
  - L.F. Edge
  - et al.
- 2011
- VLSI Technology 2011
Hot-carrier degradation in undoped-body etsoi fets and soi finfets
- - Miaomiao Wang
  - Pranita Kulkarni
  - et al.
- 2010
- IRPS 2010
Reliability of advanced high-k/metal-gate n-FET devices
- - J.H. Stathis
  - M. Wang
  - et al.
- 2010
- Microelectronics Reliability
Recovery study of negative bias temperature instability
- - Miaomiao Wang
  - Sufi Zafar
  - et al.
- 2009
- Microelectronic Engineering