Long Term NBTI Relaxation under AC and DC Biased Stress and RecoveryElnatan MataevJames Stathiset al.2019IRPS 2019
Comprehensive Methodology for Multiple Spots Competing Progressive Breakdown for BEOL/FEOL ApplicationsErnest WuBaozhen Liet al.2019IRPS 2019
On the Frequency Dependence of Bulk Trap Generation during AC Stress in Si and SiGe RMG P-FinFETsNarendra PariharUma Sharmaet al.2019IRPS 2019
Bias Temperature Instability Reliability in Stacked Gate-All-Around Nanosheet TransistorMiaomiao WangJingyun Zhanget al.2019IRPS 2019
Characterization and Analysis of Bit Errors in 3D TLC NAND Flash MemoryNikolaos PapandreouHaralampos Pozidiset al.2019IRPS 2019