Structural studies of Langmuir-Blodgett multilayers by means of soft X-ray diffractionW. JarkG. Comelliet al.1989Thin Solid Films
Absolute depth profiling of thin film systems by low energy secondary neutral mass spectrometryA. WucherH. Oechsneret al.1989Thin Solid Films
Electrical resistivity and structural changes in amorphous Ge1-xAlx thin films under thermal annealingF. CatalinaC.N. Afonsoet al.1988Thin Solid Films
Microhardness and microstructure of ion-beam-sputtered, nitrogen-doped NiFe filmsT.W. WuC. Hwanget al.1988Thin Solid Films
Effects of deposition conditions on the superconducting properties of r.f. and d.c. magnetron sputter-deposited YBa2Cu3O7-x filmsW.-Y. LeeJ.R. Salemet al.1988Thin Solid Films
Characterization of HfBx films deposited by r.f. diode and r.f. magnetron sputteringW.-Y. LeeGraham Oliveet al.1988Thin Solid Films
Quantitative X-ray fluorescence analysis of single-layer and multilayer thin filmsT.C. Huang1988Thin Solid Films