Unifying the Concepts of Offset Voltage and Common Mode Rejection RatioRichard C. Jaeger1976IEEE JSSC
High Sensitivity Charge Transfer Sense AmplifierLawrence G. HellerDominic P. Spampinatoet al.1976IEEE JSSC
High Performance MOS Integrated Circuit Using the Ion Implantation TechniqueFrank F. FangHans S. Rupprecht1975IEEE JSSC
Experimental Study of Laser Formed Connections for LSI Wafer PersonalizationLawrence KuhnStanley E. Schusteret al.1975IEEE JSSC
Special Correspondence Effect of Randomness in the Distribution of Impurity Ions on FET Thresholds in Integrated ElectronicsRobert W. Keyes1975IEEE JSSC