Reduction of penetration effect at sharp edges in the scanning electron microscope (SEM)
- Oliver C. Wells
- Phillip J. Bailey
- 2011
- Journal of Microscopy
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52 results for O.C. Wells
Some theoretical aspects of type‐1 magnetic contrast in the scanning electron microscope
- Oliver C. Wells
- 2011
- Journal of Microscopy
Relationship between type‐1 magnetic contrast in the scanning electron microscope and the vector potential of the magnetic field
- Oliver C. Wells
- Catherine A. Stoye
- 2011
- Journal of Microscopy
XY table and tilting stage for scanning electron microscope (SEM)
- Oliver C. Wells
- 2008
- Review of Scientific Instruments
Isolation of type-2 magnetic contrast in the SEM by a lock-in technique
- Oliver C. Wells
- 2008
- Applied Physics Letters
Backscattered electron imaging in the scanning electron microscope: The use of either: (A) high incident energy or (b) an array detector
- L. Gignac
- O.C. Wells
- et al.
- 2008
- Microscopy and Microanalysis
Reciprocity between the reflection electron microscope and the low-loss scanning electron microscope
- Oliver C. Wells
- 2008
- Applied Physics Letters
Use of backscattered electron detector arrays for forming backscattered electron images in the scanning electron microscope
- Oliver C. Wells
- L. Gignac
- et al.
- 2006
- Scanning
Imaging and analysis of subsurface Cu interconnects by detecting backscattered electrons in the scanning electron microscope
- L. Gignac
- M. Kawasaki
- et al.
- 2005
- Journal of Applied Physics
Top-down topography of deeply etched silicon in the scanning electron microscope
- Oliver C. Wells
- Conal E. Murray
- et al.
- 2004
- Review of Scientific Instruments