About cookies on this site Our websites require some cookies to function properly (required). In addition, other cookies may be used with your consent to analyze site usage, improve the user experience and for advertising. For more information, please review your options. By visiting our website, you agree to our processing of information as described in IBM’sprivacy statement. To provide a smooth navigation, your cookie preferences will be shared across the IBM web domains listed here.
Publication
Review of Scientific Instruments
Paper
Collector turret for scanning electron microscope
Abstract
A mechanism is described for changing the signal detector in the Cambridge "Stereoscan" scanning electron microscope without breaking the vacuum. This has three main advantages. First, it makes it easier to compare the back scattered electron image, the secondary electron image, and the luminescent image, which can help the interpretation in some cases. Second, a spare secondary electron detector can be kept in reserve for high resolution work, thus avoiding the degradation of scintillator performance that occurs after prolonged use. Finally, it makes it possible to optimize detectors by comparing different versions of the same basic design. © 1970 The American Institute of Physics.