Publications

61 results for Guy Cohen

High-resolution x-ray diffraction for characterization and monitoring of silicon-on-insulator fabrication processes
- - G.M. Cohen
  - P.M. Mooney
  - et al.
- 2002
- Journal of Applied Physics
Electrical integrity of state-of-the-art 0.13 μm SOI CMOS devices and circuits transferred for three-dimensional (3D) integrated circuit (IC) fabrication
- - K.W. Guarini
  - A. Topol
  - et al.
- 2002
- IEDM 2002
Optical constants of In _0.53Ga _0.47As/InP: Experiment and modeling
- - Martín Muñoz
  - Todd M. Holden
  - et al.
- 2002
- Journal of Applied Physics
Characterization and monitoring of silicon-on-insulator fabrication processes by high-resolution x-ray diffraction
- - G.M. Cohen
  - P.M. Mooney
  - et al.
- 2002
- MRS Proceedings 2002
A self-aligned silicide process utilizing ion implants for reduced silicon consumption and control of the silicide formation temperature
- - G.M. Cohen
  - C. Cabral Jr.
  - et al.
- 2002
- MRS Proceedings 2002
A self-aligned silicide process for thin silicon-on-insulator MOSFETs and bulk MOSFETs with shallow junctions
- - G.M. Cohen
  - C. Cabral Jr.
  - et al.
- 2001
- MRS Proceedings 2001
A patterned SOI by masked anneal for system-on-chip applications
- - G.M. Cohen
  - D.K. Sadana
- 2001
- MRS Proceedings 2001
Burstein-Moss shift of n-doped (formula presented)
- - Martín Muñoz
  - Fred H. Pollak
  - et al.
- 2001
- Physical Review B - CMMP
Triple-self-aligned, planar double-gate MOSFETs: Devices and circuits
- - K.W. Guarini
  - P. Solomon
  - et al.
- 2001
- Technical Digest-International Electron Devices Meeting
Burstein-Moss shift of n-doped In_0.53Ga_0.47As/inp
- - Martín Muñoz
  - Fred H. Pollak
  - et al.
- 2001
- Physical Review B - CMMP