Publications

This is our catalog of recent publications authored by IBM researchers, in collaboration with the global research community. We’re currently adding our back catalog of more than 110,000 publications. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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Year

18 results for Barry P. Linder

Fundamental statistical properties of reconstruction methodology for TDDB with variability in BEOL/MOL/FEOL applications
- - Ernest Y. Wu
  - James Stathis
  - et al.
- 2016
- IRPS 2016
Process optimizations for NBTI/PBTI for future replacement metal gate technologies
- - Barry P. Linder
  - A. Dasgupta
  - et al.
- 2016
- IRPS 2016
Analyzing path delays for accelerated testing of logic chips
- - Emily Ray
  - Barry P. Linder
  - et al.
- 2015
- IRPS 2015
Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements
- - Franco Stellari
  - Keith A. Jenkins
  - et al.
- 2015
- IRPS 2015
A critical analysis of sampling-based reconstruction methodology for dielectric breakdown systems (BEOL/MOL/FEOL)
- - Ernest Y. Wu
  - James Stathis
  - et al.
- 2015
- IRPS 2015
Combined ramp voltage stress and constant voltage stress for optimal BTI voltage acceleration and lifetime modeling
- - Barry P. Linder
  - Takashi Ando
- 2014
- IRPS 2014
Self-Heating Measurement of 14-nm FinFET SOI Transistors Using 2-D Time-Resolved Emission
- - Franco Stellari
  - Keith A. Jenkins
  - et al.
- 2016
- IEEE T-ED
Performance degradation analysis and hot-carrier injection impact on the lifetime prediction of LC voltage control oscillator
- - Chih-Hsiang Ho
  - Keith A. Jenkins
  - et al.
- 2015
- IEEE T-ED