Conference paperTechnique for Asymmetric Source/Drain Resistance Extraction on a Single Gate Length MOSFETPhil Oldiges, Chen Zhang, et al.SISPAD 2018
Conference paperSimulation analysis of series resistance for SOI MOSFET in nanometer regimeXinlin Wang, Phil Oldiges, et al.SISPAD 2005
PaperUltra low contact resistivities for CMOS beyond 10-nm nodeZhen Zhang, Siyuranga Obasa Koswatta, et al.IEEE Electron Device Letters
Conference paperTotal ionizing dose radiation effects on 14 nm FinFET and SOI UTBB technologiesHarold Hughes, Patrick McMarr, et al.REDW/NSREC 2015