Publications

48 results for Michael S. Gordon

Low Energy Proton SEUs in 32-nm SOI SRAMs at Low Vdd
- - Ken Rodbell
  - Michael S. Gordon
  - et al.
- 2017
- IEEE TNS
The Role of Sample Geometry on Ultra-Low Alpha Particle Emissivity Measurements
- - Michael S. Gordon
  - Ken Rodbell
  - et al.
- 2017
- IEEE TNS
Measurements of radioactive contaminants in semiconductor materials
- - Michael S. Gordon
  - Ken Rodbell
  - et al.
- 2016
- Semiconductor Science and Technology
Energy Dependent Efficiency in Low Background Alpha Measurements and Impacts on Accurate Alpha Characterization
- - Hiroyoshi Kawasaki
  - Brett M. Clark
  - et al.
- 2015
- IEEE TNS
The Role of Static Charge in Ultra-Low Alpha Particle Emissivity Measurements
- - Michael. S. Gordon
  - Kenneth P. Rodbell
  - et al.
- 2015
- IEEE TNS
New Insights Gained on Mechanisms of Low-Energy Proton-Induced SEUs by Minimizing Energy Straggle
- - N.A. Dodds
  - P.E. Dodd
  - et al.
- 2015
- IEEE TNS
SOI FinFET soft error upset susceptibility and analysis
- - Phil Oldiges
  - Ken Rodbell
  - et al.
- 2015
- IRPS 2015
Pathway to the Piezoelectronic Transduction Logic Device
- - Paul Solomon
  - Brian A. Bryce
  - et al.
- 2015
- Nano Letters
Hardness assurance for proton direct ionization-induced SEEs using a high-energy proton beam
- - Nathaniel A. Dodds
  - James R. Schwank
  - et al.
- 2014
- IEEE TNS
Criticality of low-energy protons in single-event effects testing of highly-scaled technologies
- - Jonathan A. Pellish
  - Paul W. Marshall
  - et al.
- 2014
- IEEE TNS