Publications

55 results for David F. Heidel

Hardness assurance testing for proton direct ionization effects
- - James R. Schwank
  - Marty R. Shaneyfelt
  - et al.
- 2012
- IEEE TNS
32 and 45 nm radiation-hardened-by-design (RHBD) SOI latches
- - Kenneth P. Rodbell
  - David F. Heidel
  - et al.
- 2011
- IEEE TNS
Comparison of single and two-photon absorption for laser characterization of single-event upsets in SOI SRAMs
- - James R. Schwank
  - Marty R. Shaneyfelt
  - et al.
- 2011
- IEEE TNS
Hardness assurance testing for proton direct ionization effects
- - James R. Schwank
  - Marty R. Shaneyfelt
  - et al.
- 2011
- RADECS 2011
Recent single event effects compendium of candidate electronics for NASA space systems
- - Martha V. O'Bryan
  - Kenneth A. LaBel
  - et al.
- 2011
- REDW/NSREC 2011
Electron beam testing of circuits at liquid nitrogen temperature
- - Keith A. Jenkins
  - M.J. Immediato
  - et al.
- 2011
- Scanning
Stacked devices for SEU immune design
- - Phil Oldiges
  - Kenneth P. Rodbell
  - et al.
- 2010
- IEEE International SOI Conference 2010
Impact of spacecraft shielding on direct ionization soft error rates for sub-130 nm technologies
- - Jonathan A. Pellish
  - Michael A. Xapsos
  - et al.
- 2010
- IEEE TNS
Alpha-particle emission energy spectra from materials used for solder bumps
- - Michael S. Gordon
  - Kenneth P. Rodbell
  - et al.
- 2010
- IEEE TNS
Heavy ion testing with iron at 1 GeV/amu
- - Jonathan A. Pellish
  - Michael A. Xapsos
  - et al.
- 2010
- IEEE TNS