E. Gusev, D.A. Buchanan, et al.
Technical Digest - International Electron Devices Meeting
In this letter, we report self-aligned n-channel germanium (Ge) MOSFETs with a thin Ge oxynitride gate dielectric and tungsten gate electrode. Excellent off-state current is achieved through the reduction of junction leakage. For the first time, we have demonstrated an n-channel Ge MOSFET with a subthreshold slope of 150 mV/dec and an on-off current ratio of ∼10 4.
E. Gusev, D.A. Buchanan, et al.
Technical Digest - International Electron Devices Meeting
M. Yang, K.K. Chan, et al.
VLSI Technology 2006
Changhwan Choi, Kam-Leung Lee, et al.
Applied Physics Letters
S.J. Wind, L.T. Shi, et al.
IEDM 1999