Tenko Yamashita, Veeraraghvan S. Basker, et al.
VLSI Technology 2011
In this letter, we report self-aligned n-channel germanium (Ge) MOSFETs with a thin Ge oxynitride gate dielectric and tungsten gate electrode. Excellent off-state current is achieved through the reduction of junction leakage. For the first time, we have demonstrated an n-channel Ge MOSFET with a subthreshold slope of 150 mV/dec and an on-off current ratio of ∼10 4.
Tenko Yamashita, Veeraraghvan S. Basker, et al.
VLSI Technology 2011
Takeshi Nogami, Tibor Bolom, et al.
IEDM 2010
E. Gusev, D.A. Buchanan, et al.
Technical Digest - International Electron Devices Meeting
H. Shang, H. Okorn-Schimdt, et al.
IEEE Electron Device Letters