R.W. Gammon, E. Courtens, et al.
Physical Review B
A field effect transistor device (FET), consisting of a nonlinear Mott Insulator channel material, and a high dielectric-constant gate oxide, is explored as a nanoscale device. Experimental functionality of a large scale prototype (5 μm channel length) has been demonstrated. The underlying physics of the device is analyzed and modeled using a time-dependent Hartree approach. Timing estimates suggest a relatively short switching time.
R.W. Gammon, E. Courtens, et al.
Physical Review B
Shiyi Chen, Daniel Martínez, et al.
Physics of Fluids
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
J.H. Kaufman, Owen R. Melroy, et al.
Synthetic Metals