B.A. Hutchins, T.N. Rhodin, et al.
Surface Science
A field effect transistor device (FET), consisting of a nonlinear Mott Insulator channel material, and a high dielectric-constant gate oxide, is explored as a nanoscale device. Experimental functionality of a large scale prototype (5 μm channel length) has been demonstrated. The underlying physics of the device is analyzed and modeled using a time-dependent Hartree approach. Timing estimates suggest a relatively short switching time.
B.A. Hutchins, T.N. Rhodin, et al.
Surface Science
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
Lawrence Suchow, Norman R. Stemple
JES