Thomas H. Baum, Carl E. Larson, et al.
Journal of Organometallic Chemistry
A field effect transistor device (FET), consisting of a nonlinear Mott Insulator channel material, and a high dielectric-constant gate oxide, is explored as a nanoscale device. Experimental functionality of a large scale prototype (5 μm channel length) has been demonstrated. The underlying physics of the device is analyzed and modeled using a time-dependent Hartree approach. Timing estimates suggest a relatively short switching time.
Thomas H. Baum, Carl E. Larson, et al.
Journal of Organometallic Chemistry
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
John G. Long, Peter C. Searson, et al.
JES
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting