Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
A field effect transistor device (FET), consisting of a nonlinear Mott Insulator channel material, and a high dielectric-constant gate oxide, is explored as a nanoscale device. Experimental functionality of a large scale prototype (5 μm channel length) has been demonstrated. The underlying physics of the device is analyzed and modeled using a time-dependent Hartree approach. Timing estimates suggest a relatively short switching time.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Michiel Sprik
Journal of Physics Condensed Matter
U. Wieser, U. Kunze, et al.
Physica E: Low-Dimensional Systems and Nanostructures
R.D. Murphy, R.O. Watts
Journal of Low Temperature Physics