Publication
ICMTS 2014
Conference paper

Circuits to measure the delay variability of MOSFETs

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Abstract

Two test circuits have been implemented and measured in order to characterize delay variability in individual MOSFETs. Measurement results show that both circuits have high sensitivities to gate resistance, which differentiate them from other circuits which characterize variations in traditional DC parameters such as threshold voltage and channel length. © 2014 IEEE.

Date

24 Mar 2014

Publication

ICMTS 2014

Authors

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