Raymond Wu, Jie Lu
ITA Conference 2007
In this paper, we review the current status of single-event upsets caused by alpha-particles in IBM circuits and technology. While both alpha-particles and cosmic radiation can induce upsets, the alpha-particle-induced upset rate has become an increasingly important issue because alpha-particle- induced upsets are no longer limited to memory circuits. Latch circuits have become highly sensitive to alpha-particles. The alpha-particle-induced upset rate of latch circuits is one of the most critical issues for microprocessors requiring both high performance and high reliability. © Copyright 2008 by International Business Machines Corporation.
Raymond Wu, Jie Lu
ITA Conference 2007
M.F. Cowlishaw
IBM Systems Journal
Pradip Bose
VTS 1998
Arun Viswanathan, Nancy Feldman, et al.
IEEE Communications Magazine