Identifying and Removing Artifacts Formed During FIB TEM Sample Preparation of Semiconductor Devices
- Lynne Gignac
- John Bruley
- et al.
- 2025
- AReMS 2025
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- Semiconductors
747 results for Semiconductors
LionHeart: A Layer-based Mapping Framework for Heterogeneous Systems with Analog In-Memory Computing Tiles
- Corey Liam Lammie
- Yuxuan Wang
- et al.
- 2025
- IEEE TETC
CogSys: Efficient and Scalable Neurosymbolic Cognition System via Algorithm-Hardware Co-Design
- Zishen Wan
- Hanchen Yang
- et al.
- 2025
- HPCA 2025
Enterprise Class Modular Cache Hierarchy
- Craig Walters
- Deanna Berger
- et al.
- 2025
- HPCA 2025
Workshop on Data Integrity and Secure Cloud Computing (DISCC)
- Pradip Bose
- Augusto Vega
- et al.
- 2025
- HPCA 2025
Defects induce phase transition from dynamic to static rippling in graphene
- Fabian Thiemann
- Camille Scalliet
- et al.
- 2025
- PNAS
Insights Gained from Delivering Two Generations of AI Supercomputers and Storage Solutions in IBM Cloud
- 2025
- FAST 2025
Evaluating Novel Material Stacks Towards Gate Width Roughness Reduction
- Gopal Kenath
- Martin Burkhardt
- et al.
- 2025
- SPIE Advanced Lithography + Patterning 2025
Guided Random Synthetic Layout Generation and Machine-Learning Based Defect Prediction for Leading Edge Technology Node Development
- Geng Han
- Mohamed Talbi
- et al.
- 2025
- SPIE Advanced Lithography + Patterning 2025
Multi-reticle stitching: Applications from packaging to High-NA EUV
- Chris Bottoms
- Rick Johnson
- et al.
- 2025
- SPIE Advanced Lithography + Patterning 2025