Deconvolution method for composition profiling by Auger sputtering technique
- P.S. Ho
- J.E. Lewis
- 1976
- Surface Science
Paper
Publications
3553 results for Materials Discovery
Generalized rotating-compensator ellipsometry
- P.S. Hauge
- 1976
- Surface Science
PaperSurface crystallography of the c(2×2) sodium overlayer on Al(100)
- B.A. Hutchins
- T.N. Rhodin
- et al.
- 1976
- Surface Science
PaperHydrodynamics of neurons
- W.E. Langlois
- Lee Ki-Jun
- 1976
- Comput. Methods Appl. Mech. Eng.
PaperGrowth of epitaxial films of the organic conductor (TTF)(TCNQ)
- E. Simonyi
- B.A. Scott
- et al.
- 1976
- Materials Research Bulletin
PaperPractical limitations to accuracy in a nulling automatic wavelength-scanning ellipsometer
- A.C. Lowe
- 1976
- Surface Science
PaperComment on the use of "Kramers-kronig analysis for the determination of the optical constants of thin surface films" by K. Naegele and W.J. Plieth
- Jean Horkans
- 1976
- Surface Science
PaperCore- and valence-electron spectra of clean Si surfaces by energy loss spectroscopy
- A Koma
- R Ludeke
- 1976
- Surface Science
PaperThe design of single crystal materials for magnetic bubble domain applications
- J.E. Davies
- E.A. Giess
- 1975
- Journal of Materials Science
ReviewFinite width foil bearing with light loading
- W.E. Langlois
- 1975
- Journal of Applied Mechanics, Transactions ASME
Paper