Feasible aggressor-set identification under constraints for maximum coupling noise
- Debjit Sinha
- Alex Rubin
- et al.
- 2009
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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141 results at IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
ELIAD: Efficient Lithography Aware Detailed routing algorithm with compact and macro post-OPC printability prediction
- Minsik Cho
- Kun Yuan
- et al.
- 2009
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Fast and accurate statistical criticality computation under process variations
- Hushrav D. Mogal
- Haifeng Qian
- et al.
- 2009
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Statistical blockade: Very fast statistical simulation and modeling of rare circuit events and its application to memory design
- Amith Singhee
- Rob A. Rutenbar
- 2009
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Feasible aggressor-set identification under constraints for maximum coupling noise
- Debjit Sinha
- Alex Rubin
- et al.
- 2009
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Optimal test margin computation for at-speed structural test
- Jinjun Xiong
- Vladimir Zolotov
- et al.
- 2009
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Non-Gaussian statistical timing analysis using second-order polynomial fitting
- Lerong Cheng
- Jinjun Xiong
- et al.
- 2009
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Fast and accurate statistical criticality computation under process variations
- Hushrav D. Mogal
- Haifeng Qian
- et al.
- 2009
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Signature-based SER analysis and design of logic circuits
- Smita Krishnaswamy
- Stephen M. Plaza
- et al.
- 2009
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
ELIAD: Efficient lithography aware detailed routing algorithm with compact and macro post-OPC printability prediction
- Minsik Cho
- Kun Yuan
- et al.
- 2009
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems