Some history and technology of scanning microscopy
- H.K. Wickramasinghe
- 1989
- Proceedings of SPIE 1989
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3523 results for Mathematical Sciences
Creating and observing surface features with a scanning tunneling microscope.
- J. Schneir
- P.K. Hansma
- et al.
- 1989
- Proceedings of SPIE 1989
High-Resolution Capacitance Measurement By Force Microscopy: Application To Sample Characterization And Potentiometry
- David W. Abraham
- Yves Martin
- et al.
- 1989
- Proceedings of SPIE 1989
Thermal and photo thermal imaging on a sub 100 nanometer scale
- C.C. Williams
- H.K. Wickramasinghe
- 1988
- SPIE OE/LASE 1988
The psychophysics of spatial sampling
- Bernice E. Rogowitz
- 1989
- Proceedings of SPIE 1989
Resolution of overlapping spectra using frequency-domain fluorometry
- Beniamino F. Barbieri
- Fabio De Piccoli
- et al.
- 1989
- Proceedings of SPIE 1989
A topological perspective on the structure of images
- A. Peter Blicher
- 1989
- Proceedings of SPIE 1989
Fully scaled 0.5 micron CMOS technology using variable shaped electron beam lithography
- Philip Coane
- Paul Rudeck
- et al.
- 1989
- Proceedings of SPIE 1989
A simple metal pn polymer process using pulsed electron beams in soft vacuum
- J. Krishnaswamy
- Mark Eyolfson
- et al.
- 1989
- Proceedings of SPIE 1989
Contrast and sensitivity trade-offs of resist processing in electron beam lithography at 0.5µm and below
- W. Molzen
- Michael G. Rosenfield
- et al.
- 1989
- Proceedings of SPIE 1989