John A. Hoffnagle, William D. Hinsberg, et al.
Microlithography 2003
The BSMSn source is addressed in this study. It is shown that BSMSn is not successively refinable under the Hamming distortion measure, provided that n > 2.
John A. Hoffnagle, William D. Hinsberg, et al.
Microlithography 2003
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
Sankar Basu
Journal of the Franklin Institute
W.F. Cody, H.M. Gladney, et al.
SPIE Medical Imaging 1994