William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
The ability to accurately detect those areas in plain text documents that consist of contiguous text is an important pre-process to many applications. This paper introduces a novel method that uses both spatial and linguistic knowledge in an accurate manner to provide an initial analysis of the document. This initial analysis may then be extended to provide a complete analysis of the text areas in the document.
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
Andrew Skumanich
SPIE Optics Quebec 1993
J.P. Locquet, J. Perret, et al.
SPIE Optical Science, Engineering, and Instrumentation 1998
Juliann Opitz, Robert D. Allen, et al.
Microlithography 1998