Interfacial Reaction During Metallization of Cured Polyimide: An XPS StudyN.J. ChouC.H. Tang1984JVSTA
On the phenomenological model of preferred sputtering for SIMS and Auger profiling: A critical analysisN.J. ChouM.W. Shafer1980Surface Science
An internal calibration technique for pseudobinary systems by auger electron spectroscopyR. HammerN.J. Chouet al.1976Journal of Electronic Materials
Auger and ellipsometric studies of ultra-thin PbO growth on leadN.J. ChouJ.M. Eldridgeet al.1973Journal of Electronic Materials
Effects of Insulator Thickness Fluctuations on MNOS Charge Storage CharacteristicsN.J. ChouJoseph A. Aboafet al.1972IEEE T-ED
Charge storage phenomena in Al-γ-Al2O3-SiO2-Si structuresN.J. ChouP.J. Tsang1971Metallurgical Transactions
Application of Triangular Voltage Sweep Method to Mobile Charge Studies in MOS StructuresN.J. Chou1971JES
Effects of Material and Processing Parameters on the Dielectric Strength of Thermally Grown Si02 FilmsN.J. ChouJ.M. Eldridge1970JES