Growth and scaling of oxide conduction after breakdown
- Barry P. Linder
- James H. Stathis
- et al.
- 2003
- IRPS 2003
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107 results for David J. Frank
Supply voltage strategies for minimizing the power of CMOS processors
- Jin Cai
- Yuan Taur
- et al.
- 2002
- VLSI Technology 2002
Transistor-limited constant voltage stress of gate dielectrics
- B.P. Linder
- D.J. Frank
- et al.
- 2001
- VLSI Technology 2001
Calculating the error in long term oxide reliability estimates
- B.P. Linder
- J.H. Stathis
- et al.
- 2001
- IRPS 2001
Calculating the error in long term oxide reliability estimates
- B.P. Linder
- J.H. Stathis
- et al.
- 2001
- IRPS 2001
Monte Carlo modeling of threshold variation due to dopant fluctuations
- D.J. Frank
- Y. Taur
- et al.
- 1999
- VLSI Technology 1999
Monte Carlo modeling of threshold variation due to dopant fluctuations
- D.J. Frank
- Y. Taur
- et al.
- 1999
- VLSI Circuits 1999
Comparison of high speed voltage-scaled conventional and adiabatic circuits
- D.J. Frank
- 1996
- LPED 1996
Comparison of high speed voltage-scaled conventional and adiabatic circuits
- D.J. Frank
- 1996
- LPED 1996
Power measurements of adiabatic circuits by thermoelectric technique
- P. Solomon
- D.J. Frank
- 1995
- LPE 1995