In situ contrast calibration to determine the height of individual diffusing nanoparticles in a tunable confinement
- Stefan Fringes
- Michael J. Skaug
- et al.
- 2016
- Journal of Applied Physics
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87 results for Armin Knoll
Sub-20 nm silicon patterning and metal lift-off using thermal scanning probe lithography
- Heiko Wolf
- Colin D. Rawlings
- et al.
- 2015
- JVSTB
Nanometer accurate markerless pattern overlay using thermal scanning probe lithography
- Colin Rawlings
- Urs Duerig
- et al.
- 2014
- IEEE TNANO
Meso-scale measurement of the electrical spreading resistance in highly anisotropic media
- Elad Koren
- Armin W. Knoll
- et al.
- 2014
- Applied Physics Letters
Enhancing ordering dynamics in solvent-annealed block copolymer films by lithographic hard mask supports
- Anja Stenbock-Fermor
- Armin W. Knoll
- et al.
- 2014
- Macromolecules
Control over molar mass, dispersity, end-groups and kinetics in cyclopolymerization of ortho-phthalaldehyde: Adapted choice of a phosphazene organocatalyst
- Julien De Winter
- Andrew P. Dove
- et al.
- 2014
- Polymer Chemistry
Frictional dissipation in a polymer bilayer system
- Lars Jansen
- Mark A. Lantz
- et al.
- 2014
- Langmuir
Integrated vertical microcavity using a nano-scale deformation for strong lateral confinement
- Lijian Mai
- Fei Ding
- et al.
- 2013
- Applied Physics Letters
Nanoscale contact-radius determination by spectral analysis of polymer roughness images
- 2013
- Langmuir
Thermal probe maskless lithography for 27.5 nm half-pitch Si technology
- Lin Lee Cheong
- Philip Paul
- et al.
- 2013
- Nano Letters