Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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136 results for C.T. Chuang

A New Dynamic Beta-Ratio Circuit Technique for Strained-Si Technology
- - Rajiv V. Joshi
  - Keunwoo Kim
  - et al.
- 2003
- IEEE International SOI Conference 2003
Oxide breakdown model and its impact on SRAM cell functionality
- - R. Rodríguez
  - R.V. Joshi
  - et al.
- 2003
- SISPAD 2003
Physical compact model for threshold voltage in short-channel double-gate devices
- - Keunwoo Kim
  - J.G. Fossum
  - et al.
- 2003
- SISPAD 2003
Influence and model of gate oxide breakdown on CMOS inverters
- - R. Rodríguez
  - J.H. Stathis
  - et al.
- 2003
- Microelectronics Reliability
Strained-Si devices and circuits for low-power applications
- - Keunwoo Kim
  - R.V. Joshi
  - et al.
- 2003
- ISLPED 2003
Strained-Si Devices and Circuits for Low-Power Applications
- - Keunwoo Kim
  - Rajiv V. Joshi
  - et al.
- 2003
- ISLPED 2003
Performance assessment of scaled strained-Si channel-on-insulator (SSOI) CMOS
- - Keunwoo Kim
  - Ching-Te Chuang
  - et al.
- 2002
- IEEE International SOI Conference 2002
SOI-optimized 64-bit high-speed CMOS adder design
- - Jae-Joon Kim
  - Rajiv Joshi
  - et al.
- 2002
- VLSI Circuits 2002
High performance low power V_T- wave-pipeline CMOS circuit in PD/SOI technology
- - R.V. Joshi
  - F. Yee
  - et al.
- 2002
- IEEE International SOI Conference 2002
Analysis of the effect of the gate oxide breakdown on SRAM stability
- - R. Rodríguez
  - J.H. Stathis
  - et al.
- 2002
- Microelectronics Reliability