The problem of Sr doping and interface abruptness in La2-xSrxCuO4 multilayers; the application of transmission electron microscopy

E.J. Williams; A. Cretton; Y. Jaccard; J.P. Locquet; E. Mächler; Ø. Fischer; P. Martinoli; T. Schneider

doi:10.1016/0921-4534(94)91592-X

Physica C: Superconductivity and its applications

Paper

01 Jan 1994

The problem of Sr doping and interface abruptness in La_2-xSr_xCuO₄ multilayers; the application of transmission electron microscopy

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Abstract

This represents an attempt to use the local investigative properties of transmission electron microscopy to examine the content and distribution of strontium in La2-xSrxCuO4 thin films grown by molecular beam epitaxy on (001) strontium titanate substrates. © 1994.

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