E. Burstein
Ferroelectrics
This represents an attempt to use the local investigative properties of transmission electron microscopy to examine the content and distribution of strontium in La2-xSrxCuO4 thin films grown by molecular beam epitaxy on (001) strontium titanate substrates. © 1994.
E. Burstein
Ferroelectrics
Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
Julien Autebert, Aditya Kashyap, et al.
Langmuir