A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics
The interfacial reaction paths and kinetics in highly 002-textured Al/TiN bilayers, grown on SiO2, were studied. It was found that TiN barrier failure is initiated at the Al/TiN interface with the formation of a thin continuous AlN interfacial layer which is initially in the metastable zinc-blende structure through a local epitaxial relationship with the underlying TiN.
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics
E. Burstein
Ferroelectrics
Robert W. Keyes
Physical Review B
J.V. Harzer, B. Hillebrands, et al.
Journal of Magnetism and Magnetic Materials