Conference paperComprehensive study of effective current variability and MOSFET parameter correlations in 14nm multi-fin SOI FINFETsAbhijeet Paul, Andres Bryant, et al.IEDM 2013
PaperReliability Modeling and Analysis of Hot-Carrier Degradation in Multiple-Fin SOI n-Channel FinFETs With Self-HeatingAnshul Gupta, Charu Gupta, et al.IEEE T-ED
PaperTransistor mismatch properties in deep-submicrometer CMOS technologiesXiaobin Yuan, Takashi Shimizu, et al.IEEE T-ED
Conference paperHigh-performance Si1-xGex channel on insulator trigate PFETs featuring an implant-free process and aggressively-scaled fin and gate dimensionsP. Hashemi, M. Kobayashi, et al.VLSI Technology 2013
