Keith A. Jenkins, J.Y.-C. Sun
IEEE Electron Device Letters
Rapid fluctuations of power supply values, or switching noise, can have a significant effect on VLSI circuit speed. This is shown by comparing circuit simulations with measurements of the critical path delay of a self-resetting SRAM. It is shown that including the measured high frequency noise in the circuit simulation leads to very accurate prediction of circuit speed.
Keith A. Jenkins, J.Y.-C. Sun
IEEE Electron Device Letters
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VLSI Technology 1993
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IEEE International SOI Conference 1999