Keith A. Jenkins, R.L. Franch
IEEE International SOI Conference 2003
Rapid fluctuations of power supply values, or switching noise, can have a significant effect on VLSI circuit speed. This is shown by comparing circuit simulations with measurements of the critical path delay of a self-resetting SRAM. It is shown that including the measured high frequency noise in the circuit simulation leads to very accurate prediction of circuit speed.
Keith A. Jenkins, R.L. Franch
IEEE International SOI Conference 2003
J.N. Burghartz, J.H. Comfort, et al.
IEDM 1990
James Warnock, Ghavam G. Shahidi, et al.
IEEE Electron Device Letters
Keith A. Jenkins, K. Rim
IEEE Electron Device Letters