Keith A. Jenkins, M.J. Immediato, et al.
Scanning
Rapid fluctuations of power supply values, or switching noise, can have a significant effect on VLSI circuit speed. This is shown by comparing circuit simulations with measurements of the critical path delay of a self-resetting SRAM. It is shown that including the measured high frequency noise in the circuit simulation leads to very accurate prediction of circuit speed.
Keith A. Jenkins, M.J. Immediato, et al.
Scanning
Keith A. Jenkins, J.Y.-C. Sun, et al.
IEEE Electron Device Letters
C.T. Chuang, P.F. Lu
IEDM 1989
G. Shahidi, D.D. Tang, et al.
IEDM 1991