Publication
IITC/AMC 2016
Conference paper

Formation and microstructure of thin Ti silicide films for advanced technologies

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Abstract

We report on the solid-state reaction of thin PVD Ti films with in-situ doped Si & SiGe alloys using a combination of in-situ x-ray diffraction, sheet resistance, laser light scattering measurements and ex-situ x-ray pole figure analysis. Thin Ti films or thin bilayer films (Ni/Ti or NiPt/Ti) are found to be much more aligned with the underlying substrates. Millisecond laser anneals also lead to the introduction of strong in-plane texture.

Date

08 Jul 2016

Publication

IITC/AMC 2016

Authors

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