IEEE Topical Meeting EPEPS 2005
Conference paper

Comparison of time- and frequency domain measurement results for product related card and MCM transmission lines up to 65 GHz

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Transmission line models and material parameters are extracted from time and frequency domain measurements for product related low loss card and ceramic MCM test line structures up to 65GHz. All measured results are compared to results as obtained from field calculations showing the advantages and limitations of the different methods on product driven test vehicles. © 2005 IEEE.