Losses caused by roughness of metallization in printed-circuit boards
- A. Deutsch
- C. Surovic
- et al.
- 2005
- IEEE Topical Meeting EPEPS 2005
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12 results at IEEE Topical Meeting EPEPS 2005
The general variational formulas for capacitance parameter extraction
- W.C. Chew
- L.J. Jiangt
- 2005
- IEEE Topical Meeting EPEPS 2005
Complex power distribution network investigation using SPICE based extraction from first principle formulations
- Giuseppe Selli
- James L. Drewniak
- et al.
- 2005
- IEEE Topical Meeting EPEPS 2005
Using S-parameters successfully in time domain link simulations
- Dierk Kaller
- Christian Schuster
- et al.
- 2005
- IEEE Topical Meeting EPEPS 2005
On-chip bus interleaving revisited
- I.M. Elfadel
- 2005
- IEEE Topical Meeting EPEPS 2005
The use of accelerated full-wave modeling to analyze power island coupling in a HyperBGA SCM
- J.D. Morsey
- A. Deutsch
- et al.
- 2005
- IEEE Topical Meeting EPEPS 2005
Waveform relaxation techniques for simulation of coupled interconnects with frequency-dependent parameters
- Natalie Nakhla
- Albert Ruehli
- et al.
- 2005
- IEEE Topical Meeting EPEPS 2005
Solving low frequency EM-CKT problems using the PEEC method
- Dipanjan Gope
- Albert Ruehli
- et al.
- 2005
- IEEE Topical Meeting EPEPS 2005
Electrical / optical high speed scalability link implementation
- D. Kuchta
- C. Baks
- et al.
- 2005
- IEEE Topical Meeting EPEPS 2005
Understanding how to model difficult features and related physical effects in electrical packages
- Barry J. Rubin
- 2005
- IEEE Topical Meeting EPEPS 2005