Effects of collector take‐off angle and energy filtering on the BSE image in the SEM
- Oliver C. Wells
- 2011
- Scanning
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Reduction of edge penetration effect in the scanning electron microscope
- Oliver C. Wells
- 2011
- Scanning
Quantitative image mode voltage contrast
- Keith A. Jenkins
- 2011
- Scanning
Scanning reflection image from a solid specimen in the scanning electron microscope with a condenser‐objective lens
- O.C. Wells
- 2011
- Scanning
Electron beam testing of circuits at liquid nitrogen temperature
- Keith A. Jenkins
- M.J. Immediato
- et al.
- 2011
- Scanning
A semiautomated image analysis procedure for the quantification of dental microwear
- P.S. Ungar
- J.‐C. Simon
- et al.
- 2011
- Scanning
Use of backscattered electron detector arrays for forming backscattered electron images in the scanning electron microscope
- Oliver C. Wells
- L. Gignac
- et al.
- 2006
- Scanning
Application of the low-loss scanning electron microscope image to integrated circuit technology part II - Chemically-mechanically planarized samples
- Oliver C. Wells
- Maurice McGlashan-Powell
- et al.
- 2001
- Scanning
Studies of samples having shallow surface topography by the low-loss electron (LLE) method in the scanning electron microscope (SEM)
- O.C. Wells
- Maurice McGlashen-Powell
- et al.
- 2000
- Scanning
Comparison of different models for the generation of electron backscattering patterns in the scanning electron microscope
- Oliver C. Wells
- 1999
- Scanning