On the direct measurement of diffusion at temperatures less than 0.5 Tm
- D. Gupta
- 1975
- Thin Solid Films
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- Materials Discovery
3460 results for Materials Discovery
The preparation and characterization of crystals of the superconducting polymer, (SN)x
- G.B. Street
- H. Arnal
- et al.
- 1975
- Materials Research Bulletin
Diffusion of arsenic along dislocations in epitaxial silicon films
- David R. Campbell
- K.N. Tu
- et al.
- 1975
- Thin Solid Films
Determination of the structure of ordered adsorbed layers by analysis of LEED spectra
- P.M. Marcus
- J.E. Demuth
- et al.
- 1975
- Surface Science
Interdiffusion in PbIn thin film couples
- S.K. Lahiri
- 1975
- Thin Solid Films
Kirkendall study of electromigration in thin films
- P.S. Ho
- J.E. Lewis
- et al.
- 1975
- Thin Solid Films
The mechanism of wear in magnetic recording disk files
- F.E. Talke
- J.L. Su
- 1975
- Tribology International
Sources of conduction band polarization in the driving force for electromigration
- Rolf Landauer
- 1975
- Thin Solid Films
Implanted noble gas atoms as diffusion markers in silicide formation
- W.K. Chu
- S.S. Lau
- et al.
- 1975
- Thin Solid Films
Absence of non-shorting breakdown behaviour in AlSi3N4Si structures
- N. Klein
- C.M. Osburn
- et al.
- 1975
- Thin Solid Films