H.D. Dulman, R.H. Pantell, et al.
Physical Review B
Paper
Electron scattering in silicon inversion layers by oxide and surface roughness
Abstract
No abstract available.
Related
A. Gangulee, F.M. D'Heurle
Thin Solid Films
Peter J. Price
Surface Science
A. Nagarajan, S. Mukherjee, et al.
Journal of Applied Mechanics, Transactions ASME