22nm High-performance SOI technology featuring dual-embedded stressors, Epi-Plate High-K deep-trench embedded DRAM and self-aligned Via 15LM BEOL
- S. Narasimha
- P. Chang
- et al.
- 2012
- IEDM 2012
Publications
Planning the transformation of network topologies
- Young Yoon
- Nathan Robinson
- et al.
- 2012
- AAAI 2012
Density Propagation and improved bounds on the partition function
- Stefano Ermon
- Carla P. Gomes
- et al.
- 2012
- NeurIPS 2012
Statistical measurement of random telegraph noise and its impact in scaled-down high-κ/metal-gate MOSFETs
- H. Miki
- N. Tega
- et al.
- 2012
- IEDM 2012
Biometric authentication on a mobile device: A study of user effort, error and task disruption
- Shari Trewin
- Cal Swart
- et al.
- 2012
- ACSAC 2012
An integration path for gate-first UTB III-V-on-insulator MOSFETs with silicon, using direct wafer bonding and donor wafer recycling
- Lukas Czornomaz
- N. Daix
- et al.
- 2012
- IEDM 2012
A simple and practical algorithm for differentially private data release
- Moritz Hardt
- Katrina Ligett
- et al.
- 2012
- NeurIPS 2012
Future directions for ion beam technology and research: Forum report
- John E. E. Baglin
- Daryush Ila
- 2011
- MRS Spring Meeting 2011
Sentence compression with semantic role constraints
- Katsumasa Yoshikawa
- Ryu Iida
- et al.
- 2012
- ACL 2012
Online ℓ1-dictionary learning with application to novel document detection
- Shiva Prasad Kasiviswanathan
- Huahua Wang
- et al.
- 2012
- NeurIPS 2012