A technique for comparing the bulk and surface structure of defects in thin films using the scanning transmission electron microscope.
- M.M.J. Treacy
- W. Krakow
- et al.
- 1981
- Applied Physics Letters
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2347 results at Applied Physics Letters
Two-carrier nature of interface-state generation in hole trapping and radiation damage
- S.K. Lai
- 1981
- Applied Physics Letters
Silicide films for archival optical storage
- K.N. Tu
- K.Y. Ahn
- et al.
- 1981
- Applied Physics Letters
Surface compositional modifications during O+2 bombardment of binary alloys
- Ming L. Yu
- Wilhad Reuter
- 1981
- Applied Physics Letters
Low-temperature redistribution of As in Si during Pd2Si formation
- I. Ohdomari
- K.N. Tu
- et al.
- 1981
- Applied Physics Letters
Uncertainty principle limit to the energy sensitivity of SQUID's and other linear amplifiers
- Richard F. Voss
- 1981
- Applied Physics Letters
Kinetics and mechanism of amorphous hydrogenated silicon growth by homogeneous chemical vapor deposition
- B.A. Scott
- R.M. Plecenik
- et al.
- 1981
- Applied Physics Letters
Interferometric measurements with laser FM sidebands
- G.C. Bjorklund
- K. Jain
- et al.
- 1981
- Applied Physics Letters
Low Schottky barrier of rare-earth silicide on n-Si
- K.N. Tu
- R.D. Thompson
- et al.
- 1981
- Applied Physics Letters
Magnetic domain wall waves, parametrically excited in a stripe domain lattice in a garnet film
- J.H. Spreen
- B.E. Argyle
- 1981
- Applied Physics Letters