High Tc YBa2Cu3O7-x thin films on Si substrates by dc magnetron sputtering from a stoichiometric oxide target
- W.-Y. Lee
- J.R. Salem
- et al.
- 1988
- Applied Physics Letters
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2347 results at Applied Physics Letters
Noise reduction technique for scanning tunneling microscopy
- David W. Abraham
- C.C. Williams
- et al.
- 1988
- Applied Physics Letters
Origin of contaminants in photochemically deposited chromium films
- K.A. Singmaster
- F.A. Houle
- et al.
- 1988
- Applied Physics Letters
Buried GaInAs/InP layers grown on nonplanar substrates by one-step low-pressure metalorganic vapor phase epitaxy
- Yvan D. Galeuchet
- Peter Roentgen
- et al.
- 1988
- Applied Physics Letters
Optically detected electron cyclotron resonance in silicon
- E.J. Pakulis
- G. Northrop
- 1987
- Applied Physics Letters
Electrical activation of arsenic ion-implanted polycrystalline silicon by rapid thermal annealing
- C.Y. Wong
- Y. Komem
- et al.
- 1987
- Applied Physics Letters
Studies of texture in thin films using synchrotron radiation and energy dispersive diffraction
- M. Hart
- W. Parrish
- et al.
- 1987
- Applied Physics Letters
Rapid annealing and the anomalous diffusion of ion implanted boron into silicon
- Alwin E. Michel
- W. Rausch
- et al.
- 1987
- Applied Physics Letters
Oxygen removal from Si via reaction with adsorbed Ge
- J.F. Morar
- B.S. Meyerson
- et al.
- 1987
- Applied Physics Letters
Transmission electron microscope study of the formation of Ni2Si and NiSi on amorphous silicon
- M.O. Aboelfotoh
- H.M. Tawancy
- et al.
- 1987
- Applied Physics Letters