A technique for measuring, displaying, recording, and modifying the spatial uniformity of implanted ions
- W.N. Hammer
- Alwin E. Michel
- 2008
- Journal of Applied Physics
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11 results for William N. Hammer
Oxidation mechanisms in WSi2 thin films
- S. Zirinsky
- W.N. Hammer
- et al.
- 2008
- Applied Physics Letters
Nucleation-controlled thin-film interactions: Some silicides
- R.L. Anderson
- J.E.E. Baglin
- et al.
- 2008
- Applied Physics Letters
The interaction process for Ag-Al polycrystalline thin-film couples
- J.E.E. Baglin
- F.M. D'Heurle
- et al.
- 2008
- Journal of Applied Physics
Formation of iridium silicides from Ir thin films on Si substrates
- S. Petersson
- J.E.E. Baglin
- et al.
- 2008
- Journal of Applied Physics
Shallow silicide contact
- K.N. Tu
- W.N. Hammer
- et al.
- 2008
- Journal of Applied Physics
The thin-film formation of rhodium silicides
- S. Petersson
- R.L. Anderson
- et al.
- 2008
- Journal of Applied Physics
Graded-index AR surfaces produced by ion implantation on plastic materials
- E. Spiller
- I. Hailer
- et al.
- 1980
- Applied Optics
An interface - marker technique applied to the study of metal silicide growth
- J.E.E. Baglin
- F.M. D'Heurle
- et al.
- 1980
- Nuclear Instruments and Methods
The formation of silicides in Mo-W Bilayer films on si substrates: A marker experiment
- J.E.E. Baglin
- J. Dempsey
- et al.
- 1979
- Journal of Electronic Materials