Series resistance reduction in stacked nanowire FETs for 7-nm CMOS technology
- Anil K. Bansal
- Ishita Jain
- et al.
- 2016
- IEEE J-EDS
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Ab initio study of metal grain orientation-dependent work function and its impact on FinFET variability
- Samarth Agarwal
- Rajan Kumar Pandey
- et al.
- 2013
- IEEE T-ED